NASA IGBT Accelerated Aging Dataset (PCoE) 核心 · 已核验

atlas:nasa-igbt-accelerated-aging

NASA PCoE IGBT 加速老化数据:热过应力老化试验,监测栅极/集射极电压、集电极电流与封装温度,含闩锁事件

落地页
https://www.nasa.gov/intelligent-systems-division/discovery-and-systems-health/pcoe/pcoe-data-set-repository/
国内可访问性
国内直连:可达 (2026-07-11 检测) 代理通道:可达 (2026-07-11 检测)
检测口径:lychee 双通道单轮探测;「直连超时」表示检测窗口内未完成,系慢或不稳定证据,不构成封锁证据。
设备类型
power_electronics_device
PHM 任务
rul_prediction degradation_trend_prediction
跑至失效
是

故障工况

description: 热过应力老化(含闩锁事件监测)fault_type: otherinduction: accelerated_life_test

传感器

sensor_type: voltage_sensorobserved_property: voltagemounting_note: 栅极/集射极电压
sensor_type: current_sensorobserved_property: electric_currentmounting_note: 集电极电流
sensor_type: thermocoupleobserved_property: temperaturemounting_note: 封装温度(含闩锁事件监测)

运行工况

description: 方波门控热过应力老化condition_type: other
溯源(PROV,6 条)
source_citation: curation/dataset-shortlist-v0.yaml(manual(NASA PCoE 官方))retrieved_on: 2026-07-08asserted_by: automated_harvestnote: 由清单条目初始化的最小候选卡
about_field: tasks,equipment_types,fault_conditions,run_to_failuresource_citation: facet-batch-05.yamlretrieved_on: 2026-07-08asserted_by: automated_extractionnote: 代理归纳刻面(依据:领域公知(PCoE));候选区,晋升需人工核验
about_field: sensors,operating_conditions,descriptionsource_citation: facet-batch-06.yamlretrieved_on: 2026-07-08asserted_by: automated_extractionnote: 代理归纳刻面(依据:PCoE 官方列表(2026-07-08 在线核)+领域公知);候选区,晋升需人工核验
about_field: source_citation: 人工核验:zfbin(委托批准 2026-07-10)retrieved_on: 2026-07-10asserted_by: human_curatorconfidence_level: human_verifiednote: 晋升核心区。晋升批次 07:KLS-012 系历史卡,逐卡逐断言对照自述核验(evidence/KLS-016/11)
about_field: china_accessibilitysource_citation: KLS-009 链接健康扫描(lychee 双通道)retrieved_on: 2026-07-11asserted_by: automated_harvestnote: 定期刷新标注,仅覆盖本字段;历史结果以最新扫描为准
about_field: license_confidence,notessource_citation: 人工核验:zfbin(委托批次 KLS-032,2026-07-15)retrieved_on: 2026-07-14asserted_by: human_curatorconfidence_level: human_verifiednote: 人工改写。KLS-032 license 补判:NASA PCoE 仓库页无许可声明;仅风险自担免责 + 致谢请求条款(2026-07-15 核)