Parallel-IGBT-Dataset 核心 · 已核验

doi:10.21227/y5d1-ej09

"The data from experimental results of a half-bridge inverter with parallel connected insulated gate bipolar transistor (IGBT) devices. The data set consists of data coming from the sensors placed in the circuit to measure voltages, currents, and gate driver signals of the IGBT modules. A multiple set of experiments were conducted to produce the different characteristics of the parameters. The test methodology is composed of multiple pulse tests that mimic the dynamic behavior of an inverter condition and covers different switching mode combinations of sine pulse width modulation (SPWM). The data can be used to analyze the relationship between currents and temperature in an inverter system in a connected parallel network. This data can be used to develop or validate models of inverter behavior under grid disturbances. In addition, training AI systems to detect faults or optimize control strategies and groundwork the development of better estimation techniques in the remaining useful life of IGBT using data-driven approximation"

落地页

https://ieee-dataport.org/documents/parallel-igbt-dataset

许可证

CC-BY-4.0 (判读置信:inferred)

国内可访问性

国内直连:可达 (2026-07-11 检测) 代理通道:可达 (2026-07-11 检测)
检测口径:lychee 双通道单轮探测;「直连超时」表示检测窗口内未完成,系慢或不稳定证据,不构成封锁证据。

设备类型

power_electronics_device

PHM 任务

fault_detection rul_prediction