Simulated circuit data supporting the research of analog filter circuits 核心 · 已核验

doi:10.4121/236d5e33-4156-4ba1-a640-af954f0186b2.v1

The dataset contains simulation-generated data for automated fault diagnosis in analog and mixed-signal (AMS) electronic circuits. The dataset was developed to support machine learning-based fault classification and identification in complex electronic systems exhibiting non-linear behavior and sensitivity to parameter variations.The dataset includes data collected from six different analog and mixed-signal circuit configurations operating under both fault-free and faulty conditions. The considered circuits include active filter structures such as Sallen-Key filters, Chebyshev filters and other representative AMS circuit topologies. Each circuit is simulated for multiple fault scenarios including component parametric deviations, open-circuit faults and short-circuit faults.

落地页

https://data.4tu.nl/datasets/236d5e33-4156-4ba1-a640-af954f0186b2/1

许可证

CC-BY-NC-4.0 (判读置信:unknown)

国内可访问性

国内直连:可达 (2026-07-11 检测) 代理通道:可达 (2026-07-11 检测)
检测口径:lychee 双通道单轮探测;「直连超时」表示检测窗口内未完成,系慢或不稳定证据,不构成封锁证据。

发布年份

2026

发布方

4TU.ResearchData

PHM 任务

fault_diagnosis

故障工况