Power Converter Fault Diagnosis Dataset 核心 · 已核验
doi:10.5281/zenodo.20484337
This dataset contains electrical measurements acquired from a real-time Hardware-in-the-Loop (HIL) simulation environment developed for fault diagnosis research in power electronic converters.
The simulated system corresponds to a 2 MW two-level voltage source inverter (2L-VSI) connected to a three-phase 400/690 V, 50 Hz electrical grid and a 1500 V DC bus. The model was executed on a Typhoon HIL606 real-time simulator, enabling the controlled injection of multiple fault conditions while preserving the dynamic behavior of the converter.
The dataset includes measurements collected under both nominal and faulty operating conditions. A total of 48 operating categories are represented, corresponding to one healthy operating mode and 47 fault conditions. The simulated faults include grid disturbances, DC-bus abnormalities, semiconductor failures, harmonic distortion, electrical noise, voltage deviations, frequency variations, phase-sequence alterations, short-circuits, and disconnection events.
To improve dataset diversity and reduce phase-dependent bias, fault injection was performed at randomly selected temporal instants during converter operation.
Included Measurements
This repository contains the following measurement categories:
id_mea = 10 — Three-Phase RMS Voltages
Three-dimensional measurement composed of the RMS values of the three grid voltages. This low-dimensional representation characterizes the global electrical operating condition of the converter and the grid.
Dimensions: 3
id_mea = 3 — Instantaneous DC Voltage and Current
High-dimensional instantaneous measurements containing the DC-link capacitor voltage and input current sampled at switching frequency. The resulting vectorized representation captures transient and dynamic behaviors associated with fault conditions.
Dimensions: 40
id_mea = 2 — Instantaneous Three-Phase Currents
High-dimensional vectorized representation of the three-phase grid currents sampled at switching frequency. The me
- 落地页
- https://zenodo.org/doi/10.5281/zenodo.20484337
- 许可证
- CC-BY-4.0 (判读置信:inferred)
- 国内可访问性
-
国内直连:直连超时(慢或不稳定,非封锁证据) (2026-07-11 检测)
代理通道:可达 (2026-07-11 检测)
检测口径:lychee 双通道单轮探测;「直连超时」表示检测窗口内未完成,系慢或不稳定证据,不构成封锁证据。 - 发布年份
- 2026
- 发布方
- Zenodo
- 设备类型
power_electronics_device- PHM 任务
fault_diagnosis
故障工况
| fault_type: healthy_baseline |
| fault_type: power_electronics_fault |
溯源(PROV,6 条)
| source_url: https://api.datacite.org/dois/10.5281/zenodo.20484337source_citation: DataCite REST 反查(KLS-019,query=fault diagnosis)retrieved_on: 2026-07-10asserted_by: automated_harvestnote: 补量候选(281→300+),经全量人工复核入库;晋升需人工核验 |
| about_field: equipment_typessource_citation: graphrag 抽取自论文 doi:10.5281/zenodo.20484337(model=glm-5.2, temperature=0)retrieved_on: 2026-07-10asserted_by: automated_extractionconfidence_level: grounded_nativenote: values: power_electronics_device;候选区,晋升需人工核验(ADR-26) |
| about_field: fault_conditionssource_citation: graphrag 抽取自论文 doi:10.5281/zenodo.20484337(model=glm-5.2, temperature=0)retrieved_on: 2026-07-10asserted_by: automated_extractionconfidence_level: grounded_nativenote: values: healthy_baseline, power_electronics_fault;候选区,晋升需人工核验(ADR-26) |
| about_field: taskssource_citation: graphrag 抽取自论文 doi:10.5281/zenodo.20484337(model=glm-5.2, temperature=0)retrieved_on: 2026-07-10asserted_by: automated_extractionconfidence_level: grounded_nativenote: values: fault_diagnosis;候选区,晋升需人工核验(ADR-26) |
| about_field: source_citation: 人工核验:zfbin(委托批准 2026-07-10)retrieved_on: 2026-07-10asserted_by: human_curatorconfidence_level: human_verifiednote: 晋升核心区。晋升批次 04:KLS-019 补量卡,逐卡逐断言对照自述核验(evidence/KLS-016/07) |
| about_field: china_accessibilitysource_citation: KLS-009 链接健康扫描(lychee 双通道)retrieved_on: 2026-07-12asserted_by: automated_harvestnote: 定期刷新标注,仅覆盖本字段;历史结果以最新扫描为准 |