NASA IGBT Accelerated Aging Dataset (PCoE) · MuxHub Atlas

NASA IGBT Accelerated Aging Dataset (PCoE) 核心 · 已核验

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NASA PCoE IGBT 加速老化数据:热过应力老化试验,监测栅极/集射极电压、集电极电流与封装温度,含闩锁事件

本卡描述如含来自官方页的原文片段,其版权归原作者,不在本站 CC-BY 4.0 许可范围(见关于与许可)。

落地页: https://www.nasa.gov/intelligent-systems-division/discovery-and-systems-health/pcoe/pcoe-data-set-repository/
国内可访问性: 国内直连:可达 (2026-07-11 检测) 非直连:可达 (2026-07-11 检测)
「直连超时」表示检测窗口内未完成,系慢或不稳定证据,不构成封锁证据。
设备类型: power_electronics_device
PHM 任务: rul_prediction degradation_trend_prediction
跑至失效: 是

故障工况

传感器

运行工况

关联论文(10 篇)

仅表示这篇论文与本数据集在文献网络中相邻, 不代表该论文确实使用了本数据集。

Integrated IGBT with Tiny Learning of Radial Basis Networks for Remaining Useful Lifetime Estimation 2026 · 用于方法验证
A Multi-Agent System for Automated Lifetime Prediction of Power Electronics 2026 · 用于方法验证
Development of encoder-multivariate time-series transformer for remaining useful life prediction of IGBTs 2026 · 用于方法验证
Device-Wise Conformal Calibration of Nonnegative IGBT Remaining-Life Intervals for Power-Electronic Systems under Limited Accelerated-Aging Data 2026 · 用于方法验证
Device-Wise Conformal Calibration of Nonnegative IGBT Remaining-Life Intervals for Power-Electronic Systems under Limited Accelerated-Aging Data 2026 · 用于方法验证
Device-Wise Conformal Calibration of Nonnegative IGBT Remaining-Life Intervals for Power-Electronic Systems under Limited Accelerated-Aging Data 2026 · 用于方法验证
Mitigating Multiphysics Interference in Semiconductor Aging via Physics-Embedded Incremental Evolution 2026 · 用于方法验证
Prior-Guided Diffusion Processes: A Unified Framework for Knowledge-Informed Generative Modeling with Theoretical Guarantees and Prognostic Case Studies 2026 · 用于迁移/跨工况
applezug/PID-for-Component-Deg: v1.0.0 2026 · 用于迁移/跨工况
applezug/PID-for-Component-Deg: v1.0.0 2026 · 用于迁移/跨工况

溯源(10 条)